Data Analysis Methods and the Impact to HVM #1

About This Course

This course provides an overview understanding of High Volume Manufacturing (HVM) and Overall Equipment Efficiency (OEE).

Learning Objectives

Successful students will be able to:

  • Understand what is High Volume Manufacturing, the process steps from Wafer to Final Test.
  • Understand the importance of Yield defect modelling and factors affecting yield
  • Understand OEE and factors associate with it.

Prerequisites

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Target Audience

Product or Test Engineer

Training Outline

  1.  High Volume Manufacturing (HVM)
  2. =Overall Equipment Effectiveness (OEE)